Crack detection in semiconductor products : machine vision techniques for detection of cracks in semiconductor products

Duraisingam, Prithivi Ram (2014) Crack detection in semiconductor products : machine vision techniques for detection of cracks in semiconductor products.

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Item Type:Essay (Master)
Faculty:EEMCS: Electrical Engineering, Mathematics and Computer Science
Subject:53 electrotechnology, 54 computer science
Programme:Embedded Systems MSc (60331)
Link to this item:http://purl.utwente.nl/essays/66133
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