University of Twente Student Theses

Login

The Effect of Thermal Annealing on Stress-Induced Leakage Current in Gate Oxides

Keizer, A.A. (2021) The Effect of Thermal Annealing on Stress-Induced Leakage Current in Gate Oxides.

Full text not available from this repository.

Full Text Status:Access to this publication is restricted
Embargo date:2 July 2024
Item Type:Essay (Bachelor)
Faculty:EEMCS: Electrical Engineering, Mathematics and Computer Science
Subject:51 materials science, 53 electrotechnology
Programme:Electrical Engineering BSc (56953)
Link to this item:http://purl.utwente.nl/essays/87352
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page