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Characterization of segregation in nanometer thin films using hybrid X-ray measurements

Hendrikx, C.P. (2020) Characterization of segregation in nanometer thin films using hybrid X-ray measurements.

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Item Type:Essay (Master)
Faculty:EEMCS: Electrical Engineering, Mathematics and Computer Science
Programme:Applied Mathematics MSc (60348)
Link to this item:https://purl.utwente.nl/essays/88708
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