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Self Healing MOSFETs: Investigation into the Time Dependency of Recovery in the High-κ dielectric HfO2

Hu, Dennis (2022) Self Healing MOSFETs: Investigation into the Time Dependency of Recovery in the High-κ dielectric HfO2.

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Full Text Status:Access to this publication is restricted
Embargo date:1 July 2032
Item Type:Essay (Bachelor)
Faculty:EEMCS: Electrical Engineering, Mathematics and Computer Science
Subject:51 materials science, 53 electrotechnology
Programme:Electrical Engineering BSc (56953)
Link to this item:https://purl.utwente.nl/essays/91971
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