University of Twente Student Theses


Automatic Wafer Level Testing of Optical Chips

Goldhoorn, Jaap (2022) Automatic Wafer Level Testing of Optical Chips.

[img] PDF
Abstract:Automated wafer level testing could provide a huge time saving in testing optical chips. Newly developed parabolic micromirrors could aid in making this possible for a wide spectrum of wavelengths. This thesis explores the viability of creating an automated setup equipment using equipment that is available at the photonics lab at the University of Twente. We find that alignment should be reasonably possible. Using computer vision to aid in alignment poses a larger challenge.
Item Type:Essay (Bachelor)
Faculty:TNW: Science and Technology
Subject:50 technical science in general
Programme:Electrical Engineering BSc (56953)
Link to this item:
Export this item as:BibTeX
HTML Citation
Reference Manager


Repository Staff Only: item control page