University of Twente Student Theses

Login

Automatic Wafer Level Testing of Optical Chips

Goldhoorn, Jaap (2022) Automatic Wafer Level Testing of Optical Chips.

[img] PDF
4MB
Abstract:Automated wafer level testing could provide a huge time saving in testing optical chips. Newly developed parabolic micromirrors could aid in making this possible for a wide spectrum of wavelengths. This thesis explores the viability of creating an automated setup equipment using equipment that is available at the photonics lab at the University of Twente. We find that alignment should be reasonably possible. Using computer vision to aid in alignment poses a larger challenge.
Item Type:Essay (Bachelor)
Faculty:TNW: Science and Technology
Subject:50 technical science in general
Programme:Electrical Engineering BSc (56953)
Link to this item:https://purl.utwente.nl/essays/92978
Export this item as:BibTeX
EndNote
HTML Citation
Reference Manager

 

Repository Staff Only: item control page