Author(s): Burgt, A.P. van der (2023)
Abstract:
In research on applying Machine learning to Embedded systems in the field, little research has been done in the evaluation of deployed devices. Often a system is trained with lots of data, hoping to encapsulate everything that a deployed system may encounter. Next to that, real-life data encapsulates the need to research data which has not been seen yet and thus research the influence of out-of-distribution data. In this research, attention will be brought to the evaluation of deployed edge devices and the trade-off between evaluation reliability and power consumption. Furthermore, the trade-off between using cloud hardware and edge hardware is discussed, where it finally culminates in the trade-off between fine-tuning on the edge versus fine-tuning in the cloud. These questions should give insight into the evaluation of a deployed system using edge intelligence, as well as how best to train and further fine-tune these systems
Document(s):
Burgt_MA_EEMCS.pdf