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Measurement protocol for stress induced leakage current in MOS-capacitors

Pruis, L.M. (2023) Measurement protocol for stress induced leakage current in MOS-capacitors.

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Full Text Status:Access to this publication is restricted
Embargo date:30 June 2026
Item Type:Essay (Bachelor)
Clients:
Unknown organization
Faculty:EEMCS: Electrical Engineering, Mathematics and Computer Science
Subject:53 electrotechnology
Programme:Electrical Engineering BSc (56953)
Link to this item:https://purl.utwente.nl/essays/95976
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