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Characterisation of Si3N4 ring resonators

Wiersma, P. and Amram, R. (2013) Characterisation of Si3N4 ring resonators.

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Abstract:The characterisation of ring resonators has been carried out to explore the qualities of Si3N4 as a medium for the confinement of light. Characterising ring resonators is an important first step in using these structures for research into nonlinear optical effects (such as Raman lasing) as the extent of the usability of the structures can be predicted. Raman lasing has been measured and characterised in other materials such as silica and silicon [1][2], but either the losses are high or the nonlinear effects are hard to achieve in these materials. By using Si3N4 as a medium, we introduce a favourable mode profile and very low losses which yields a high quality factor. A range of Si3N4 ring resonators has been characterised in terms of free spectral range (FSR) and resonance width (FWHM), as such fully describing the operation of the system. Knowing the quality factor of the structure allows for a quantitative assessment of the possibilities for Raman lasing in Si3N4 waveguides.
Item Type:Essay (Bachelor)
Faculty:TNW: Science and Technology
Subject:33 physics
Programme:Applied Physics BSc (56962)
Link to this item:http://purl.utwente.nl/essays/63815
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