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Relation between Surface Roughness and Adhesion as studied with AFM

Kostakos, John (2013) Relation between Surface Roughness and Adhesion as studied with AFM.

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Abstract:The surface roughness and adhesion for Chromium Nitride samples are studied with Atomic Force Microscopy. The CrN samples were sputtered by Ion Bombardment with 1.5 keV Ar+ in normal incidence for different time sputtering. The morphology change is determined in terms of RMS roughness and Adhesion force. In addition Contact Angle and Four Profe Surface Resistance measurements were performed in all samples. As a reference an unsputtered sample was used and a polished flat CrN sample as well. From the surface statistics we observed a surface smoothening for the first 20 minutes of sputtering and a surface roughening from 30 to 60 minutes. The adhesion force was measured using force-distance measurement revealing an inversely proportional relation to the roughness values as predicted by the theory [1]. From the contact angle experiment the hydrophobicity of the surface was determined. The surface sheet resistance is increasing proportionally to the sputtering times as revealed from the four probe resistivity measurements.
Item Type:Essay (Master)
Faculty:TNW: Science and Technology
Subject:33 physics
Programme:Applied Physics MSc (60436)
Link to this item:http://purl.utwente.nl/essays/64529
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