Experimental investigation of new device test structures for determining the lifetime in solar cells

Alizada, R. (2016) Experimental investigation of new device test structures for determining the lifetime in solar cells.

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Abstract:Octagonal ring-shaped test structures have been developed for experimental investigation of charge carrier flows in p-type regions configured as the emitter of a vertical pnp transistor. An I-V characterization of the test structures is performed to evaluate their suitability for investigating the electrical performance of emitters for n-type crystalline solar cell in terms of surface recombination and minority carrier lifetimes. The emitter regions in this study are formed by using pure boron (PureB) depositions under different processing conditions. The base current, ideally formed by injection of electrons into the emitter, is found for the region of interest by using a differential measurement technique. For solar cells, the emitter should preferably be designed to suppress the injection of electrons as much as possible. Differences in the emitter efficiency between the fabricated emitters are identified and related to the method of processing.
Item Type:Essay (Bachelor)
Faculty:EEMCS: Electrical Engineering, Mathematics and Computer Science
Subject:53 electrotechnology
Programme:Electrical Engineering BSc (56953)
Link to this item:http://purl.utwente.nl/essays/71239
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