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Interface trap density extraction from the subthreshold slope of FDSOI devices

Vermeer, M. (2019) Interface trap density extraction from the subthreshold slope of FDSOI devices.

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Item Type:Essay (Master)
Faculty:EEMCS: Electrical Engineering, Mathematics and Computer Science
Subject:50 technical science in general, 51 materials science, 53 electrotechnology, 58 process technology
Programme:Electrical Engineering MSc (60353)
Link to this item:https://purl.utwente.nl/essays/78920
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