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Extracting the reaction kinetics of the formation of CIGS from in-situ X-ray diffraction measurements

Cloet, J.M. de (2017) Extracting the reaction kinetics of the formation of CIGS from in-situ X-ray diffraction measurements.

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Abstract:During the formation of the CIGS layer in thin film solar cells, many chemical reactions occur. To gain more insight in these reactions, in-situ X-ray diffraction (XRD) measurements are performed at TNO/Solliance. We developed a tool to analyze the diffraction patterns that result from the XRD measurements. This analysis includes the quantification of the different components and the extraction of the reaction kinetics. The quantification is done by fitting the profile function of the Rietveld method on the diffraction pattern with nonlinear optimization techniques. Next, we use the change in concentration to determine the reaction rates of the individual reactions by solving a linear program and least squares optimization methods.
Item Type:Essay (Master)
Clients:
TNO, Eindhoven, Netherlands
Faculty:EEMCS: Electrical Engineering, Mathematics and Computer Science
Subject:31 mathematics, 35 chemistry, 51 materials science
Programme:Applied Mathematics MSc (60348)
Link to this item:https://purl.utwente.nl/essays/72833
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