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Characterization of segregation in nanometer thin films using hybrid X-ray measurements

Hendrikx, Cedric (2020) Characterization of segregation in nanometer thin films using hybrid X-ray measurements.

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Full Text Status:Access to this publication is restricted
Embargo date:31 September 2021
Item Type:Essay (Master)
Faculty:EEMCS: Electrical Engineering, Mathematics and Computer Science
Subject:30 exact sciences in general, 31 mathematics, 33 physics
Programme:Applied Mathematics MSc (60348)
Link to this item:http://purl.utwente.nl/essays/84074
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